Sample thickness affects contrast and measured shape in TEM images and in electron tomograms

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1016/j.micron.2023.103562
AuthorSearch for: 1; Search for: ; Search for: 1
Affiliation
  1. National Research Council of Canada. Nanotechnology
FunderSearch for: Natural Sciences and Engineering Research Council of Canada; Search for: National Research Council Canada
FormatText, Article
Subjecttransmission electron microscopy (tem); multiple scattering; electron tomography; image quality; top-bottom effect; thick sample; nanoparticle shape
Abstract
Publication date
PublisherElsevier
In
LanguageEnglish
Peer reviewedYes
IdentifierS0968432823001609
NRC numberNRC-NANO 279
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Record identifier05248727-6491-4212-b991-0cdd27b59703
Record created2024-02-08
Record modified2024-02-08
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