Towards quantitative electron holography: precision in specimen thickness dependence removal
Towards quantitative electron holography: precision in specimen thickness dependence removal
| Author | Search for: 1; Search for: 1 |
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| Affiliation |
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| Format | Text, Address |
| Conference | 34th Annual Meeting of the Microscopical Society of Canada, June 12–15, 2007, Edmonton, Alberta, Canada |
| Publication date | 2007-06-15 |
| Publisher | Microscopical Society of Canada |
| Language | English |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 06c32233-a486-4302-99bd-eb636d24c7e3 |
| Record created | 2021-09-20 |
| Record modified | 2021-09-20 |
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