Hot-carrier induced degradation and recovery in polysilicon-emitter bipolar transistors
Hot-carrier induced degradation and recovery in polysilicon-emitter bipolar transistors
DOI | Resolve DOI: https://doi.org/10.1016/S0038-1101(02)00112-0 |
---|---|
Author | Search for: ; Search for: 1; Search for: 1; Search for: ; Search for: |
Affiliation |
|
Format | Text, Article |
Publication date | 2002 |
In | |
NPARC number | 12744019 |
Export citation | Export as RIS |
Report a correction | Report a correction (opens in a new tab) |
Record identifier | 07fa4a8e-7dcb-4e81-99c6-c018673591d2 |
Record created | 2009-10-27 |
Record modified | 2020-03-30 |
- Date modified: