Comparison of InGaAs MOSFETs with Germanium-on-Insulator CMOS

DOI	Resolve DOI: https://doi.org/10.1016/j.mssp.2006.08.066
Author	Search for: Chin, A.; Search for: Chen, C.; Search for: Yu, D. S.; Search for: Kao, H. L.; Search for: McAlister, Sean¹; Search for: Chi, C. C.
Affiliation	National Research Council Canada. NRC Institute for Microstructural Sciences
Format	Text, Article
Publication date	2006
In	Materials Science in Semiconductor Processing 9, no. 4-5 (2006): 711–715.
NPARC number	12743779
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Record identifier	085385d2-0c69-4a9f-a285-3cfb0c6bf0c8
Record created	2009-10-27
Record modified	2020-04-22

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