| Download | - View accepted manuscript: Corrosion of electronic components by hydrogen fluoride (PDF, 675 KiB)
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| DOI | Resolve DOI: https://doi.org/10.1177/1042391507080810 |
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| Author | Search for: Kim, A. K.1; Search for: Crampton, G. P.1 |
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| Affiliation | - National Research Council of Canada. NRC Institute for Research in Construction
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| Format | Text, Article |
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| Subject | Suppression |
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| Abstract | Generation of Hydrogen Fluoride (HF) from fire suppression by some gaseous agents is a major concern, because HF causes corrosion. Without proper precautions, the HF corrosion damage to some electronic facilities could be significant. A study was carried out to evaluate the corrosion effect of HF on electronic equipment. This paper describes the details of the corrosion assessment study and provides test results of the corrosion damage assessments. The test results showed that surface corrosion on the electronic boards was visible when the test specimen was exposed to HF concentrations above 1000 ppm for 1 h. Test results also showed that the video card with many attached components was much more vulnerable to HF corrosion damage than the other test boards. The functionality of the video card was affected even at a relatively low HF concentration of 500 ppm. |
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| Publication date | 2008-02-01 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NRC number | NRCC 49219
NRC-IRC-18292 |
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| NPARC number | 20378060 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 094c2640-9b05-4117-bbfd-1a7309017730 |
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| Record created | 2012-07-24 |
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| Record modified | 2020-04-15 |
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