Hot-carrier stressing of NPN polysilicon emitter bipolar transistors incorporating fluorine
Hot-carrier stressing of NPN polysilicon emitter bipolar transistors incorporating fluorine
DOI | Resolve DOI: https://doi.org/10.1109/TED.2003.812502 |
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Format | Text, Article |
Publication date | 2003 |
In | |
NPARC number | 12744782 |
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Record identifier | 0a2eee07-2099-45b3-bf47-8dc01c37729a |
Record created | 2009-10-27 |
Record modified | 2020-04-02 |
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