Language selection

Government of Canada / Gouvernement du Canada

Search

Hot-carrier stressing of NPN polysilicon emitter bipolar transistors incorporating fluorine

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1109/TED.2003.812502
AuthorSearch for: ; Search for: 1; Search for: 1; Search for: 1; Search for: ; Search for:
Affiliation
  1. National Research Council Canada. NRC Institute for Microstructural Sciences
FormatText, Article
Publication date
In
  • IEEE Transactions on Electronic Devices 50, no. 4 (2003): 1141–1144.
NPARC number12744782
Export citationExport as RIS
Report a correctionReport a correction (opens in a new tab)
Record identifier0a2eee07-2099-45b3-bf47-8dc01c37729a
Record created2009-10-27
Record modified2020-04-02
Date modified: