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Convenient contrast enhancement by hole-free phase plate in a TEM

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1017/S1431927610055807
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Affiliation
  1. National Research Council of Canada. National Institute for Nanotechnology
FormatText, Article
ConferenceMicroscopy and Microanalysis 2010, 1-5 August 2010, Portland, Oregon, USA
Publication date
In
  • Microscopy and Microanalysis 16, no. Supplement S2 (1 July 2010): 526–527.
LanguageEnglish
Peer reviewedYes
NPARC number21268170
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Record identifier0e80605f-4245-45f8-859b-10f4df491f50
Record created2013-05-16
Record modified2020-04-17
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