| Download | - View accepted manuscript: Silicon-chip-based real-time dispersion monitoring for 640 Gbit/s DPSK signals (PDF, 1.2 MiB)
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| DOI | Resolve DOI: https://doi.org/10.1109/JLT.2011.2141974 |
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| Author | Search for: Vo, Trung D.; Search for: Corcoran, Bill; Search for: Schroder, Jochen; Search for: Pelusi, Mark D.; Search for: Xu, Dan-Xia1; Search for: Densmore, Adam1; Search for: Ma, Rubin1; Search for: Janz, Siegfried1; Search for: Moss, David J.; Search for: Eggleton, Benjamin |
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| Affiliation | - National Research Council of Canada. NRC Institute for Microstructural Sciences
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| Format | Text, Article |
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| Subject | nonlinear optics; optical performance monitoring (OPM); optical planar waveguides; optical signal processing; spectral analysis |
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| Abstract | We demonstrate silicon-chip-based instantaneous chromatic dispersion monitoring (GVD) for an ultrahigh bandwidth 640 Gbit/s differential phase-shift keying (DPSK) signal. This monitoring scheme is based on cross-phase modulation in a highly nonlinear silicon nanowire. We show that two-photon absorption and free-carrier-related effects do not compromise the GVD monitoring performance, making our scheme a reliable on-chip CMOS-compatible, all-optical, and real-time impairment monitoring approach for up to Terabit/s DPSK signals. |
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| Publication date | 2011-06-03 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 19577557 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 0f068f69-b397-49dc-8f20-ed96f7d4ae68 |
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| Record created | 2012-02-29 |
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| Record modified | 2020-04-21 |
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