Irradiation-induced structural changes in hydrogenated amorphous silicon as measured by x-ray photoemission spectroscopy
Irradiation-induced structural changes in hydrogenated amorphous silicon as measured by x-ray photoemission spectroscopy
| DOI | Resolve DOI: https://doi.org/10.1016/S0927-0248(02)00444-0 |
|---|---|
| Author | Search for: ; Search for: ; Search for: ; Search for: |
| Format | Text, Article |
| Publication date | 2003 |
| In | |
| NPARC number | 12744846 |
| Export citation | Export as RIS |
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| Record identifier | 13a81920-a5d1-4e65-a1c0-0e331136cf33 |
| Record created | 2009-10-27 |
| Record modified | 2020-04-02 |
- Date modified: