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Cs corrected bright field imaging of radiation sensitive materials

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1017/S1431927605501053
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Affiliation
  1. National Research Council of Canada. National Institute for Nanotechnology
FormatText, Article
Publication date
In
  • Microscopy and Microanalysis 11, no. S02 (August 2005): 2150–2151.
LanguageEnglish
Peer reviewedYes
NRC number41
NPARC number12338418
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Record identifier17a4f602-a765-46db-ba6b-d1f298d8fc36
Record created2009-09-10
Record modified2020-04-07
Date modified: