Patterson analysis for layer profile determination by neutron or X-ray reflectometry
Patterson analysis for layer profile determination by neutron or X-ray reflectometry
DOI | Resolve DOI: https://doi.org/10.1107/S0021889812015075 |
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Author | Search for: 1 |
Affiliation |
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Format | Text, Article |
Subject | neutron reflectometry; X-ray reflectometry; layer profile determination; Patterson analysis |
Abstract | |
Publication date | 2012-05-04 |
In | |
Language | English |
Peer reviewed | Yes |
NPARC number | 21268028 |
Export citation | Export as RIS |
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Record identifier | 1a834bae-f4d6-4009-adf4-de0f72c4d48b |
Record created | 2013-04-04 |
Record modified | 2020-04-21 |
- Date modified: