| Download | - View accepted manuscript: Composition and strain contrast of Si1-xGex (x = 0.20) and Si1-yCy (y < 0.015) epitaxial strained films on (100) Si in annular dark field images (PDF, 1.8 MiB)
|
|---|
| DOI | Resolve DOI: https://doi.org/10.1063/1.3082019 |
|---|
| Author | Search for: Wu, Xiaohua1; Search for: Baribeau, Jean-Marc1 |
|---|
| Affiliation | - National Research Council of Canada. NRC Institute for Microstructural Sciences
|
|---|
| Format | Text, Article |
|---|
| Publication date | 2009 |
|---|
| In | |
|---|
| Language | English |
|---|
| Peer reviewed | Yes |
|---|
| NPARC number | 12441077 |
|---|
| Export citation | Export as RIS |
|---|
| Report a correction | Report a correction (opens in a new tab) |
|---|
| Record identifier | 1b306486-5c3e-40af-9449-c2d991dbf05b |
|---|
| Record created | 2009-09-25 |
|---|
| Record modified | 2023-04-17 |
|---|
