| Download | - View accepted manuscript: Composition and strain contrast of Si1-xGex (x = 0.20) and Si1-yCy (y < 0.015) epitaxial strained films on (100) Si in annular dark field images (PDF, 1.8 MiB)
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| DOI | Resolve DOI: https://doi.org/10.1063/1.3082019 |
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| Author | Search for: Wu, Xiaohua1; Search for: Baribeau, Jean-Marc1 |
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| Affiliation | - National Research Council Canada. NRC Institute for Microstructural Sciences
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| Format | Text, Article |
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| Publication date | 2009 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 12441077 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 1b306486-5c3e-40af-9449-c2d991dbf05b |
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| Record created | 2009-09-25 |
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| Record modified | 2023-04-17 |
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