| Download | - View accepted manuscript: Implementation of long-wavelength cut-off filters based on critical angle (PDF, 853 KiB)
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| DOI | Resolve DOI: https://doi.org/10.1364/AO.50.00C396 |
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| Author | Search for: Guo, Yanen1; Search for: Dobrowolski, J. A.1; Search for: Li, Li1; Search for: Poitras, Daniel1; Search for: Tiwald, Tom |
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| Affiliation | - National Research Council of Canada. NRC Institute for Microstructural Sciences
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| Format | Text, Article |
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| Abstract | Our first attempts at the fabrication of long-wavelength infrared cut-off filters with extended transmission and rejection regions that are based on the use of the critical angle, the dispersion of refractive indices, and on thin-film interference were not very successful. The design of the filter consisted of layers placed at the interface between two high-index prisms. Using the available deposition equipment, the layers produced were porous and very rough. The pores adsorbed water vapor, which resulted in absorption. The roughness made the process of optical contacting very difficult. In this paper we describe the adjustments in the design and deposition processes that allowed us to obtain filters with a better and more stable performance. |
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| Publication date | 2011-02-18 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 17453110 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 1f519471-321a-4491-b967-2ddc157e341d |
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| Record created | 2011-03-26 |
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| Record modified | 2020-04-21 |
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