| DOI | Resolve DOI: https://doi.org/10.1557/PROC-0928-GG10-05 |
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| Author | Search for: Gospodyn, James; Search for: Taschuk, Michael T.; Search for: Hrudey, Peter C. P.; Search for: Tsui, Ying Y.; Search for: Fedosejevs, Robert; Search for: Brett, Michael J.; Search for: Sit, Jeremy C. |
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| Format | Text, Article |
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| Subject | luminescence; optical properties; photoemission |
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| Abstract | Periodic high-/low-index film stacks of Y2O3:Eu were grown with varying periodicities us-ing the glancing angle deposition (GLAD) technique onto silicon and fused silica substrates. Post-deposition annealing at temperatures from 600 to 1000°C for 1 hour in atmosphere was per-formed to enhance the photoluminescent output of the films. The films were optically character-ized using transmission measurements and Mueller matrix ellipsometry. The luminescence was measured using a spectrometer calibrated for absolute intensity measurements using a frequency-quadrupled Nd:YAG pulsed laser as an excitation source. Absolute conversion efficiencies were measured for the films by characterizing the angular emission profile. The angular emission pro-file of the films was found to follow a non-Lambertian emission profile, with peak emission in-tensities at 50° to 60° with respect to the substrate normal. |
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| Publication date | 2006-09-01 |
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| Publisher | Springer |
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| In | |
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| Series | |
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| Peer reviewed | Yes |
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| NRC number | NRC-NINT-269 |
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| NPARC number | 8926139 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 208be9a7-9702-4ea3-a469-93f5ba17bc17 |
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| Record created | 2009-04-23 |
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| Record modified | 2023-03-15 |
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