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αRAM: an α particle detecting MOS IC for radon monitoring

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1109/MNRC.2008.4683381
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FormatText, Article
Conference2008 1st Microsystems and Nanoelectronics Research Conference (MNRC 2008), October 15, 2008, Ottawa, ON, Canada
Abstract
A custom integrated circuit (“αRAM”) capable of detecting the α particles emitted in the decay of radon and its progeny has been designed, fabricated and successfully tested. The αRAM has been incorporated in a complete radon monitor using electrostatic concentration of radon progeny. The monitor can detect hazardous levels of radon within hours.
Publication date
PublisherIEEE
In
  • 2008 1st Microsystems and Nanoelectronics Research Conference: 73–76.
LanguageEnglish
Peer reviewedYes
NRC publication
This is a non-NRC publication

"Non-NRC publications" are publications authored by NRC employees prior to their employment by NRC.

NPARC number23001039
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Record identifier20a740f7-344f-4255-9894-f849d1c8ccd8
Record created2016-12-02
Record modified2020-04-15
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