Electron beam-induced effects on Bi6S2015 nanowires: an insight of stability and applications

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DOIResolve DOI: https://doi.org/10.1017/S143192761900922X
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  1. National Research Council of Canada. Nanotechnology
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ConferenceMicroscopy and Microanalysis 2019, Aug 4-8, 2019, Portland, Oregon, USA
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PublisherCambridge University Press
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LanguageEnglish
Peer reviewedYes
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Record identifier20ae4741-16c1-4b94-83c8-f2566e98d993
Record created2019-08-08
Record modified2020-05-30
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