| Abstract | In this paper, we describe an apparatus capable of measuring electrical resistance and light transmission through a flexible transparent conductor (TC) as it is actively deformed. The measurements are performed in situ with time resolution on the order of ~100 ms, and the resistance/transmission data is further used to calculate TC figures-of-merit in real-time. With this instrument, we are able to track and compare the evolution of figures-of-merit for different TCs as they are actively deformed. To demonstrate the tool, we evaluate several common TCs including indium tin oxide, poly(3,4- ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS), and silver nanowires, as well as a more unconventional nanowire/PEDOT:PSS hybrid. As expected, indium tin oxide degrades rapidly with strain, while the more flexible PEDOT:PSS is far more strain tolerant. The nanowire/PEDOT:PSS composite is found to produce an advantageous effect, as the silver nanowires generate large figures-of-merit at low strain, and the addition of a PEDOT:PSS component vastly improves strain tolerance. |
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