A single trapped strontium ion: a first step towards an improved frequency standard
A single trapped strontium ion: a first step towards an improved frequency standard
| DOI | Resolve DOI: https://doi.org/10.1109/CPEM.1990.110020 |
|---|---|
| Author | Search for: ; Search for: |
| Sponsor | Search for: Institute of Electrical and Electronics Engineers; Search for: National Research Council of Canada |
| Format | Text, Article |
| Conference | CPEM'90, Conference on Precision Electromagnetic Measurements, June 11-14, 1990, Ottawa, Ontario, Canada |
| Publication date | 1990 |
| In | |
| Language | English |
| NRC number | NRC-INMS-4441 |
| NPARC number | 8899243 |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 2449c736-3cf9-4de7-9cf3-bfa3a18a416d |
| Record created | 2009-04-22 |
| Record modified | 2024-03-07 |
- Date modified: