| Abstract | This IEEE/OSA Journal of Lightwave Technology special issue on “Guided Lightwaves for Sensors & Measurement Systems: Advanced Techniques and Applications” is organized by the IEEE Instrumentation and Measurement Society. It aims to highlight the advancement of guided lightwaves in applications to sensors, instrumentation and measurement. The special issue includes both comprehensive review articles and original technical contributions covering the rapid advancement of guided lightwaves in the applications to instrumentation and measurement. 18 invited papers and 22 contributed papers will be published in this issue. The authors are from universities, government labs and industries. We hope that this JLT Special Issue will provide an in-depth look at the topic areas and serve as a valuable reference for the current and future scientists, engineers, and technical applicators working in the related fields. |
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