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New measurements of the elastic properties of composition modulated Cu-Ni thin films

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1063/1.103034
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FormatText, Article
Subjectthin film composition; ultrasonics; elastic moduli; elasticity
Abstract
Using a new ultrasonic method which relies on the measurement of the in-phase and quadrature components of a continuous ultrasonic excitation as a function of position, we have measured the flexural modulus of composition modulated Cu-Ni self-supporting thin films. For some of the films, we have also observed the shear (S z ) modulus (allowing the calculation of the biaxial and Young’s moduli). No enhancement of these moduli was observed for composition wavelengths in the range of 17–40 Å.
Publication date
In
  • Applied Physics Letters 56, no. 20 (14 May 1990): 1959–1961.
LanguageEnglish
Peer reviewedYes
NRC publication
This is a non-NRC publication

"Non-NRC publications" are publications authored by NRC employees prior to their employment by NRC.

NPARC number21273071
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Record identifier37e97c1d-782a-4d00-8d75-6eafbe89308f
Record created2014-12-11
Record modified2020-03-17
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