TEM studies of Au/Si epilayer interfaces

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1017/S1431927609095658
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Affiliation
  1. National Research Council of Canada. National Institute for Nanotechnology
FormatText, Article
ConferenceMicroscopy and Microanalysis 2009, 26-30 July 2009, Richmond, Virginia, USA
Publication date
PublisherCambridge University Press
In
LanguageEnglish
Peer reviewedYes
NPARC number19739576
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Record identifier3baca7a4-50f2-4557-923f-ac2c9708d2b8
Record created2012-03-30
Record modified2020-04-16
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