Characterization of thin layered structures using deconvolution techniques in time-domain and Fourier-domain optical coherence tomography

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1117/12.778745
AuthorSearch for: 1ORCID identifier: https://orcid.org/0000-0002-6150-1920; Search for: 1; Search for: 1ORCID identifier: https://orcid.org/0000-0002-9831-8273; Search for: 1; Search for: 1
EditorSearch for: Armitage, John1
Affiliation
  1. National Research Council of Canada. NRC Industrial Materials Institute
FormatText, Article
ConferencePhotonics North 2007, June 4-7, 2007, Ottawa, Ontario, Canada
Subjectoptical coherence tomography; deconvolution; electronic filtering; composites; reflectors; resolution enhancement technologies; Fourier transforms; glasses; optical filters; epoxies
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LanguageEnglish
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