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Optimized Cs-corrected imaging of radiation-sensitive high-resolution objects

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1017/S1431927606067341
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Affiliation
  1. National Research Council Canada. National Institute for Nanotechnology
FormatText, Article
ConferenceMicroscopy and Microanalysis 2006, 30 July-3 August 2005, Chicago, Illinois, USA
Publication date
In
  • Microscopy and Microanalysis 12, no. Supplement S02 (31 July 2006): 1458 CD–1459 CD.
LanguageEnglish
Peer reviewedYes
NPARC number12338025
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Record identifier3e4eda5d-a220-419d-a3b6-dfe9994dae3d
Record created2009-09-10
Record modified2020-04-22
Date modified: