Quality evaluation of ultra-thin samples: application to graphene

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1002/jemt.22869
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Name affiliation
  1. National Research Council of Canada. National Institute for Nanotechnology
FormatText, Article
Journal titleMicroscopy Research and Technique
ISSN1059-910X
1097-0029
Volume80
Issue8
Pages823–830
Abstract
Many new materials emerging are strictly two dimensional (2D), often only one or two monolayers thick. They include transition metal dichalcogenides, such as MoS2, and graphene. Graphene in particular appears to have many potential applications. Typically the crystalline film without contamination is of interest. Therefore, a reliable method is needed to routinely evaluate the quality of the synthesized samples. Here, we present one such candidate method that utilizes standard electron diffraction and low/medium magnification imaging in a rudimentary transmission electron microscope. The electron irradiation dose is very low thus reducing electron irradiation damage of the investigated samples. As an example, the method was applied to the evaluation of as-grown graphene sample quality and a study on heating-induced change in graphene. It can be used to evaluate the volume and areal ratio of crystalline to noncrystalline component. The method is amiable to automated film quality evaluation.
Publication date
PublisherWiley
LanguageEnglish
Peer reviewedYes
NPARC number23002390
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Record created2017-10-26
Record modified2020-03-16
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