Quality evaluation of ultra-thin samples: application to graphene
Quality evaluation of ultra-thin samples: application to graphene
DOI | Resolve DOI: https://doi.org/10.1002/jemt.22869 |
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Author | Search for: Cui, K.1; Search for: Bosnick, K.1; Search for: Indoe, R.1; Search for: Malac, M.1; Search for: Mcleod, R. A.1 |
Name affiliation |
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Format | Text, Article |
Journal title | Microscopy Research and Technique |
ISSN | 1059-910X 1097-0029 |
Volume | 80 |
Issue | 8 |
Pages | 823–830 |
Abstract | |
Publication date | 2017-03-29 |
Publisher | Wiley |
Language | English |
Peer reviewed | Yes |
NPARC number | 23002390 |
Export citation | Export as RIS |
Report a correction | Report a correction |
Record identifier | 4214584e-afb9-48e4-a521-bbff20df5ef8 |
Record created | 2017-10-26 |
Record modified | 2020-03-16 |