| Download | - View accepted manuscript: Transmission electron microscopy investigation of interfacial reactions between SrFeO3 thin films and silicon substrates (PDF, 7.7 MiB)
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| DOI | Resolve DOI: https://doi.org/10.1557/JMR.2007.0005 |
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| Author | Search for: Wang, Dashan; Search for: Tunney, Jim1; Search for: Du, Xiaomei1; Search for: Post, Michael1; Search for: Gauvin, Raynald |
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| Affiliation | - National Research Council of Canada. NRC Institute for Chemical Process and Environmental Technology
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| Format | Text, Article |
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| Subject | interfacial reactions; thin films; silicon substrates; pulsed laser deposition |
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| Publication date | 2007 |
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| Access condition | |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NRC number | NRCC 51693 |
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| NPARC number | 9073357 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 428ecab3-f032-48c7-ba88-dba16b5b2765 |
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| Record created | 2009-10-03 |
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| Record modified | 2020-05-10 |
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