Choosing wavelengths and assessing blunder risk for the method of exact fractions
Choosing wavelengths and assessing blunder risk for the method of exact fractions
DOI | Resolve DOI: https://doi.org/10.1088/1681-7575/abd0cf |
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Author | Search for: 1 |
Affiliation |
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Format | Text, Article |
Subject | interferometry; exact fractions; excess fractions; length metrology; multi-wavelength; blunder risk |
Abstract | |
Publication date | 2021-01-21 |
Publisher | IOP Publishing |
In | |
Language | English |
Peer reviewed | Yes |
Export citation | Export as RIS |
Report a correction | Report a correction (opens in a new tab) |
Record identifier | 455b24fa-a529-4dbf-84d9-221bbeed88c4 |
Record created | 2021-04-27 |
Record modified | 2021-04-27 |
- Date modified: