Choosing wavelengths and assessing blunder risk for the method of exact fractions

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1088/1681-7575/abd0cf
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Affiliation
  1. National Research Council of Canada. Metrology Research Centre
FormatText, Article
Subjectinterferometry; exact fractions; excess fractions; length metrology; multi-wavelength; blunder risk
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PublisherIOP Publishing
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LanguageEnglish
Peer reviewedYes
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Record identifier455b24fa-a529-4dbf-84d9-221bbeed88c4
Record created2021-04-27
Record modified2021-04-27
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