Versatile approach for frequency resolved wavefront characterization

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1117/12.886304
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Name affiliation
  1. National Research Council Canada
FormatText
TypeArticle
Proceedings titleFrontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XI
Series titleProceedings of SPIE; no. 7925
ConferenceFrontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XI, January 23-26, 2011, San Francisco, CA, USA
ISSN0277-786X
1996-756X
ISBN9780819484628
Article number79250U
SubjectAttosecond pulse; Beam characteristics; Beam properties; Characterization techniques; Coherent radiation; Diffractograms; Electromagnetic radiation; High harmonic generation; High harmonics; Laser experiments; Molecular levels; Optical reconstruction; Oscillator amplifier; Physical process; Quantum properties; Spatial characterization; Spectral region; Temporal profile; wavefront sensing; X-ray free electron lasers; Xuv radiation; Diffraction patterns; Electromagnetic waves; Electron optics; Free electron lasers; Harmonic analysis; Harmonic generation; Industrial applications; Interferometry; Lasers; Wavefronts
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PublisherSPIE
LanguageEnglish
Peer reviewedYes
NPARC number21276166
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Record created2015-09-28
Record modified2019-08-28
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