Versatile approach for frequency resolved wavefront characterization
Versatile approach for frequency resolved wavefront characterization
DOI | Resolve DOI: https://doi.org/10.1117/12.886304 |
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Author | Search for: Frumker, E.1; Search for: Paulus, G.G.; Search for: Niikura, H.1; Search for: Villeneuve, D.M.1; Search for: Corkum, P.B.1 |
Name affiliation |
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Format | Text, Article |
Proceedings title | Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XI |
Series title | Proceedings of SPIE; no. 7925 |
Conference | Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XI, January 23-26, 2011, San Francisco, CA, USA |
ISSN | 0277-786X 1996-756X |
ISBN | 9780819484628 |
Article number | 79250U |
Subject | Attosecond pulse; Beam characteristics; Beam properties; Characterization techniques; Coherent radiation; Diffractograms; Electromagnetic radiation; High harmonic generation; High harmonics; Laser experiments; Molecular levels; Optical reconstruction; Oscillator amplifier; Physical process; Quantum properties; Spatial characterization; Spectral region; Temporal profile; wavefront sensing; X-ray free electron lasers; Xuv radiation; Diffraction patterns; Electromagnetic waves; Electron optics; Free electron lasers; Harmonic analysis; Harmonic generation; Industrial applications; Interferometry; Lasers; Wavefronts |
Abstract | |
Publication date | 2011 |
Publisher | SPIE |
Language | English |
Peer reviewed | Yes |
NPARC number | 21276166 |
Export citation | Export as RIS |
Report a correction | Report a correction | Record identifier | 4646dfa6-c8fd-4da9-a6af-fbe47f82e702 |
Record created | 2015-09-28 |
Record modified | 2020-04-21 |