Cracking phenomena in In(0.25)Ga(0.75)AS films on InP substrates

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DOIResolve DOI: https://doi.org/10.1016/S1359-6454(99)00211-6
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FormatText
TypeArticle
Journal titleActa Materialia
Volume47
Issue12
Pages33833394; # of pages: 12
Subjectanalytical electron microscopy; compound semiconductors; fracture
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NPARC number21276883
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Record identifier4a3e57b6-0160-41c0-beae-b1c4d1b230b8
Record created2015-10-30
Record modified2019-03-06
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