Download | - View accepted manuscript: Subwavelength grating crossings for silicon wire waveguides (PDF, 955 KiB)
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DOI | Resolve DOI: https://doi.org/10.1364/OE.18.016146 |
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Author | Search for: Bock, Przemek J.1; Search for: Cheben, Pavel1ORCID identifier: https://orcid.org/0000-0003-4232-9130; Search for: Schmid, Jens H.1; Search for: Lapointe, Jean1; Search for: Delâge, André1; Search for: Xu, Dan-Xia1; Search for: Janz, Siegfried1; Search for: Densmore, Adam1; Search for: Hall, Trevor J. |
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Affiliation | - National Research Council of Canada. NRC Institute for Microstructural Sciences
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Format | Text, Article |
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Abstract | We report on the design, simulation and experimental demonstration of a new type of waveguide crossing based on subwavelength gratings in silicon waveguides. We used 3D finite-difference time-domain simulations to minimize loss, crosstalk and polarization dependence. Measurement of fabricated devices show that our waveguide crossings have a loss as low as −0.023 dB/crossing, polarization dependent loss of < 0.02 dB and crosstalk <-40 dB. |
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Publication date | 2010-07-19 |
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In | |
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Language | English |
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Peer reviewed | Yes |
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NPARC number | 17326687 |
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Export citation | Export as RIS |
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Report a correction | Report a correction (opens in a new tab) |
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Record identifier | 4ce7e52d-df34-433c-8537-5b70b7121ecd |
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Record created | 2011-03-26 |
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Record modified | 2020-04-17 |
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