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Simultaneous laser beam profiling and scaling using Diffraction Edge Waves (DEW)

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1117/12.938632
AuthorSearch for: 1; Search for:
Affiliation
  1. National Research Council of Canada
FormatText, Article
Conference1986 Quebec Symposium (Optical Testing and Metrology), June 3-6, 1986, Quebec City, Canada
Abstract
A simple method of laser beam profiling using a scanning knife-edge is presented. Instead of monitoring the nonobstructed part of the beam as is usually done, the photo-detector is placed completely outside the beam and measures the light intensity of the DEW. Thus the spatial profile of very small Gaussian beams is obtained directly on an oscilloscope without any inversion procedure. By using the DEW emitted by another beam focused through a grating it is also possible to get a spatial calibration scale.
Publication date
PublisherSPIE
In
  • Optical Testing and Metrology: 315–321.
Series
  • Proceedings of SPIE, no. 0661.
LanguageEnglish
Peer reviewedYes
NRC numberNRCC 25834
NRC-IGM 86-000-302
NPARC number23004042
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Record identifier5be59e2b-16b2-4d09-9e12-095fcedcb55b
Record created2018-09-19
Record modified2020-03-17
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