Fully printed and encapsulated SWCNT-based thin film transistors via a combination of R2R gravure and inkjet printing

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DOIResolve DOI: https://doi.org/10.1021/acsami.6b06838
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Name affiliation
  1. National Research Council Canada. Security and Disruptive Technologies
  2. National Research Council Canada. Measurement Science and Standards
FormatText
TypeArticle
Journal titleACS Applied Materials & Interfaces
ISSN1944-8244
1944-8252
Subjectfully printed; thin film transistor; enriched semiconducting carbon nanotube ink; SWCNT ink formulation; roll-to-roll
Abstract
Fully printed thin film transistors (TFT) based on poly(9,9-di-n-dodecylfluorene) (PFDD) wrapped semiconducting single walled carbon nanotube (SWCNT) channels are fabricated by a practical route that combines roll-to-roll (R2R) gravure and ink jet printing. SWCNT network density is easily controlled via ink formulation (concentration and polymer:CNT ratio) and jetting conditions (droplet size, drop spacing, and number of printed layers). Optimum inkjet printing conditions are established on Si/SiO₂ in which an ink consisting of 6:1 PFDD:SWCNT ratio with 50 mg L⁻¹ SWCNT concentration printed at a drop spacing of 20 μm results in TFTs with mobilities of ∼25 cm² V⁻¹ s⁻¹ and on-/off-current ratios > 105. These conditions yield excellent network uniformity and are used in a fully additive process to fabricate fully printed TFTs on PET substrates with mobility values > 5 cm² V⁻¹ s⁻¹ (R2R printed gate electrode and dielectric; inkjet printed channel and source/drain electrodes). An inkjet printed encapsulation layer completes the TFT process (fabricated in bottom gate, top contact TFT configuration) and provides mobilities > 1 cm² V⁻¹ s⁻¹ with good operational stability, based on the performance of an inverter circuit. An array of 20 TFTs shows that most have less than 10% variability in terms of threshold voltage, transconductance, on-current, and subthreshold swing.
Publication date
LanguageEnglish
Peer reviewedYes
NPARC number23000810
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