Electrical-Stress Effects and Device Modeling of 0.18mm RF MOSFETS

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1109/TED.2006.870284
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  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
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NPARC number12744711
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Record identifier5d461c0f-e473-4d8c-91e1-4145689e4d2e
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