Electrical-Stress Effects and Device Modeling of 0.18mm RF MOSFETS
Electrical-Stress Effects and Device Modeling of 0.18mm RF MOSFETS
| DOI | Resolve DOI: https://doi.org/10.1109/TED.2006.870284 |
|---|---|
| Author | Search for: ; Search for: ; Search for: ; Search for: ; Search for: 1; Search for: |
| Affiliation |
|
| Format | Text, Article |
| Publication date | 2006 |
| In | |
| NPARC number | 12744711 |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 5d461c0f-e473-4d8c-91e1-4145689e4d2e |
| Record created | 2009-10-27 |
| Record modified | 2020-04-22 |
Page details
From:
- Date modified: