Polarized Raman scattering and localized embedded strain in self-organized Si/Ge nano-structures
Polarized Raman scattering and localized embedded strain in self-organized Si/Ge nano-structures
| DOI | Resolve DOI: https://doi.org/10.1063/1.1628403 |
|---|---|
| Author | Search for: ; Search for: ; Search for: ; Search for: ; Search for: ; Search for: 1; Search for: 1 |
| Affiliation |
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| Format | Text, Article |
| Publication date | 2003 |
| In | |
| Language | English |
| Peer reviewed | Yes |
| NPARC number | 12744738 |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 5e8604ca-e7de-44d9-a77b-b37f7ea98aff |
| Record created | 2009-10-27 |
| Record modified | 2023-05-10 |
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