X-ray and electrical characterization of optimized Ti/Al/Ti/Au ohmic contacts for AlGaN/GaN HEMTs
X-ray and electrical characterization of optimized Ti/Al/Ti/Au ohmic contacts for AlGaN/GaN HEMTs
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Affiliation |
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Format | Text, Article |
Conference | 208th ECS Meeting, 16-21 October 2005, Los Angeles, California |
Publication date | 2005 |
In | |
Language | English |
Peer reviewed | Yes |
NPARC number | 12346239 |
Export citation | Export as RIS |
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Record identifier | 60ce5016-953e-4bd5-9f91-9ece89e47a80 |
Record created | 2009-09-17 |
Record modified | 2020-04-07 |
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