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X-ray and electrical characterization of optimized Ti/Al/Ti/Au ohmic contacts for AlGaN/GaN HEMTs

From National Research Council Canada

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Affiliation
  1. National Research Council Canada. NRC Institute for Microstructural Sciences
FormatText, Article
Conference208th ECS Meeting, 16-21 October 2005, Los Angeles, California
Publication date
In
  • ECS Transactions 1, no. 2 (2005): 266–274.
LanguageEnglish
Peer reviewedYes
NPARC number12346239
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Record identifier60ce5016-953e-4bd5-9f91-9ece89e47a80
Record created2009-09-17
Record modified2020-04-07
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