| DOI | Resolve DOI: https://doi.org/10.1109/TIM.2008.2006960 |
|---|
| Author | Search for: Tang, Y.; Search for: Wood, Barry1; Search for: Hamilton, C. A. |
|---|
| Affiliation | - National Research Council of Canada. Measurement Science and Standards
|
|---|
| Format | Text, Article |
|---|
| Conference | 2008 Conference on Precision Electromagnetic Measurements digest: CPEM 2008, June 8-13, 2008, Broomfield, Colorado, USA |
|---|
| Abstract | A two-way Josephson voltage standard (JVS) direct comparison between the National Institute of Standards and Technology (NIST) and the National Research Council (NRC) has been conducted. The process consists of two comparisons: first, using the NRC JVS with the NRC's measuring system (hardware and software) to measure the 10 V provided by the NIST JVS and then using the NIST JVS measuring system to measure the 10 V provided by the NRC JVS. The results of the two comparisons are in agreement to within 0.7 nV, and their mean indicates that the difference between the two JVSs at 10 V is -0.28 nV, with a pooled combined uncertainty of 2.07 nV (k = 2) or a relative uncertainty of 2.1 parts in 1010. |
|---|
| Publication date | 2008-12-09 |
|---|
| Publisher | IEEE |
|---|
| In | |
|---|
| Language | English |
|---|
| Peer reviewed | Yes |
|---|
| NRC number | NRC-INMS-4550 |
|---|
| NPARC number | 8899238 |
|---|
| Export citation | Export as RIS |
|---|
| Report a correction | Report a correction (opens in a new tab) |
|---|
| Record identifier | 62143956-e8cd-458f-b3e8-c1176e11572a |
|---|
| Record created | 2009-04-22 |
|---|
| Record modified | 2020-04-15 |
|---|
