| DOI | Resolve DOI: https://doi.org/10.1016/j.jallcom.2012.07.042 |
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| Author | Search for: Ferguson, P. P.; Search for: Fleischauer, M. D.1; Search for: Laforge, J. M.; Search for: Todd, A. D. W.2; Search for: Li, P.1; Search for: Dahn, J. R. |
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| Affiliation | - National Research Council of Canada. Security and Disruptive Technologies
- National Research Council of Canada. Measurement Science and Standards
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| Format | Text, Article |
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| Subject | Tin cobalt carbon; Small angle neutron scattering; Transmission electron microscopy; Li-ion battery negative electrode; Sputtering; Mechanical alloying |
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| Abstract | Small angle neutron scattering (SANS) and transmission electron microscopy (TEM) have been used to qualitatively analyze the structure of Sn30Co30C40 alloys produced by vertical axis mechanical attriting to those produced by magnetron sputter deposition. From SANS and TEM, CoSn grains embedded in a carbon matrix structure were observed for all samples. The size of CoSn grains in the attrited samples was approximately 10 ± 3 nm by both TEM and SANS, while that of the sputtered samples was about 7 times smaller. |
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| Publication date | 2012-11-15 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| Identifier | S0925838812012339 |
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| NPARC number | 21268781 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 66b52c50-fb1d-47a0-a118-68e0cc2eeaed |
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| Record created | 2013-11-12 |
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| Record modified | 2020-04-21 |
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