The measurement of the period and strain of semiconductor superlattice systems using HREM
The measurement of the period and strain of semiconductor superlattice systems using HREM
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| Format | Text, Article |
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| Language | English |
| NPARC number | 12338646 |
| Export citation | Export as RIS |
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| Record identifier | 690e10af-989b-45fd-8339-8bcb38ad5131 |
| Record created | 2009-09-10 |
| Record modified | 2020-04-16 |
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