| Download | - View accepted manuscript: Chiral modulations and reorientation effects in MnSi thin films (PDF, 866 KiB)
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| DOI | Resolve DOI: https://doi.org/10.1103/PhysRevB.85.094429 |
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| Author | Search for: Karhu, E. A.; Search for: Roßler, U. K.; Search for: Bogdanov, A. N.; Search for: Kahwaji, S.; Search for: Kirby, B. J.; Search for: Fritzsche, H.1; Search for: Robertson, M. D.; Search for: Majkrzak, C. F.; Search for: Monchesky, T. L. |
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| Affiliation | - National Research Council of Canada. NRC Canadian Neutron Beam Centre
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| Format | Text, Article |
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| Abstract | We present an experimental and theoretical investigation of the influence of a uniaxial magnetocrystalline anisotropy on the magnetic textures that are formed in a chiral magnetic system. We show that the epitaxially induced tensile stress in MnSi thin films grown on Si(111) creates an easy-plane uniaxial anisotropy. The magnetoelastic shear stress coefficient is derived from SQUID magnetometry measurements in combination with transmission electron microscopy and x-ray diffraction data. Density functional calculations of the magnetoelastic coefficient support the conclusion that the uniaxial anisotropy originates from the magnetoelastic coupling. Theoretical calculations based on a Dzyaloshinskii model that includes an easy-plane anisotropy predict a variety of modulations to the magnetic order that are not observed in bulk MnSi crystals. Evidence for these states is found in the magnetic hysteresis and polarized neutron reflectometry measurements. |
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| Publication date | 2012-03-27 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 20209244 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 6ce36bf6-6720-46f4-a24a-3143893b5a87 |
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| Record created | 2012-06-27 |
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| Record modified | 2020-04-21 |
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