Means of mitigating the limits to characterization of radiation sensitive samples in an electron microscope
Means of mitigating the limits to characterization of radiation sensitive samples in an electron microscope
| Author | Search for: |
|---|---|
| Format | Text, Address |
| Conference | 2015 CAP Congress / Congrès de l’ACP 2015, June 15-19, 2015, Edmonton, Alberta |
| Publication date | ca 2015-06-16 |
| Language | English |
| Export citation | Export as RIS |
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| Record identifier | 6d729ca4-ae9d-48ba-8d2a-f732349f546a |
| Record created | 2021-08-26 |
| Record modified | 2021-08-26 |
- Date modified: