Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEM

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1016/j.ultramic.2018.02.003
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  1. National Research Council of Canada. Nanotechnology
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PublisherElsevier
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LanguageEnglish
Peer reviewedYes
NPARC number23002830
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Record identifier6d816a79-9d25-4897-8f88-71d8cb436176
Record created2018-03-08
Record modified2020-03-16
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