Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEM
Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEM
DOI | Resolve DOI: https://doi.org/10.1016/j.ultramic.2018.02.003 |
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Author | Search for: Hayashida, Misa1 ; Search for: Cui, Kai1 ; Search for: Malac, Marek1 ; Search for: Egerton, Ray |
Name affiliation |
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Format | Text |
Type | Article |
Journal title | Ultramicroscopy |
ISSN | 0304-3991 1879-2723 |
Volume | 188 |
Pages | 8–12 |
Abstract | |
Publication date | 2018-02-16 |
Publisher | Elsevier |
Language | English |
Peer reviewed | Yes |
NPARC number | 23002830 |
Export citation | Export as RIS |
Report a correction | Report a correction | Record identifier | 6d816a79-9d25-4897-8f88-71d8cb436176 |
Record created | 2018-03-08 |
Record modified | 2018-03-08 |