| Abstract | Angle-resolved (AR) RABBITT measurements offer a high information content measurement scheme, due to the presence of multiple, interfering, ionization channels combined with a phase-sensitive observable in the form of angle and time-resolved photoelectron interferograms. In order to explore the characteristics and potentials of AR-RABBITT, a perturbative 2-photon model is developed; based on this model, example AR-RABBITT results are computed for model and real systems, for a range of RABBITT schemes. These results indicate some of the phenomena to be expected in AR-RABBITT measurements, and suggest various applications of the technique in photoionization metrology. |
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