Photoluminescence in UHV-CVD-grown Si[1-x]Ge[x] quantum wells on Si(100): band alignment variation with excitation density and applied uniaxial stress

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1016/S0040-6090(98)00466-0
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FormatText, Article
Journal titleThin Solid Films
ISSN0040-6090
Volume321
IssueMay 26
Pages158162
Publication date
LanguageEnglish
Identifier10276968
NRC numberNRC-INMS-1115
NPARC number5764357
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Record identifier8058f970-ff3d-48ed-addd-383cd1099f61
Record created2009-03-29
Record modified2020-03-20
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