Matrix effects in sims depth profiles of SiGe superlattices

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1016/0168-583X(90)90907-C
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ConferenceNinth International Conference on Ion Beam Analysis, June 26-30, 1989, Kingston, Ontario, Canada
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PublisherElsevier
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LanguageEnglish
NRC numberNRC-INMS-4347
NPARC number8896706
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Record identifier82439d9f-fbfb-4556-acea-a9b4f45d72f4
Record created2009-04-22
Record modified2024-02-13
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