Permanent phase correction in a polarization diversity Si PIC by femtosecond laser pulses

From National Research Council Canada

DOI	Resolve DOI: https://doi.org/10.1109/LPT.2015.2444394
Author	Search for: Bachman, Daniel; Search for: Chen, Zhijiang; Search for: Westwood-bachman, Jocelyn N.; Search for: Hiebert, Wayne K.; Search for: Painchaud, Yves; Search for: Poulin, Michel; Search for: Fedosejevs, Robert; Search for: Tsui, Ying Y.; Search for: Van, Vien
Format	Text
Type	Article
Journal title	IEEE Photonics Technology Letters
ISSN	1041-1135 1941-0174
Volume	27
Issue	17
Pages	1880–1883
Subject	femtosecond laser tuning; silicon photonics; DPSK demodulator; polarization diversity
Abstract	We report a fast and efficient method for permanently correcting fabrication-induced phase errors in silicon photonic circuits. The method uses femtosecond laser pulses at 400-nm wavelength to amorphize a thin layer of crystalline silicon near the waveguide surface, thereby inducing a change in the effective index of the waveguide. Using a single femtosecond laser pulse, we reduced the polarization-dependent frequency shift between the two interferometers of a polarization diversity differential phase shift keying silicon demodulator from 11 GHz to less than 0.5 GHz, thereby restoring the polarization diversity operation of the circuit with little degradation to the circuit performance.
Publication date	2015-09-01
Publisher	IEEE
Language	English
Peer reviewed	Yes
NPARC number	23001581
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Record identifier	82db6ca9-6458-4fc7-8f55-7c3891d56f23
Record created	2017-03-08
Record modified	2020-02-06

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Date modified:: 2020-02-21