Raman spectroscopy and optical properties of porous silicon

DOI	Resolve DOI: https://doi.org/10.1007/978-94-011-1683-1_37
Author	Search for: Lockwood, D. J.¹; Search for: Aers, G. C.¹; Search for: Allard, L. B.¹; Search for: Bryskiewicz, B.¹; Search for: Charbonneau, S.¹; Search for: Houghton, D. C.¹; Search for: Wang, A.
Name affiliation	National Research Council of Canada. NRC Institute for Microstructural Sciences
Format	Text, Book chapter
Book title	Phonons in Semiconductor Nanostructures
Series title	NATO ASI Series; no. 236
ISSN	0168-132X
ISBN	978-94-010-4736-4 978-94-011-1683-1
Pages	383–392
Subject	physics, general; condensed matter physics; optical and electronic materials; surfaces and interfaces, thin films
Abstract	Raman spectroscopy has shown that porous Si films produced by electrochemical and chemical dissolution of Si contain crystalline Si wires and spherites ~ 3 nm in diameter and/or amorphous Si. The optical absorption and photoluminescence spectra obtained from most of the samples are consistent with the quantum confinement of excitons in Si nanostructures. Other samples composed only of amorphous Si produced a different photoluminescence attributed to the formation of silicon oxyhydride species.
Publication date	1993
Language	English
Peer reviewed	Yes
NPARC number	23000346
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Record identifier	89afdd17-692e-48c5-91de-4cfc0dc6d8e6
Record created	2016-07-08
Record modified	2020-06-10