Raman spectroscopy and optical properties of porous silicon

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1007/978-94-011-1683-1_37
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Name affiliation
  1. National Research Council Canada. NRC Institute for Microstructural Sciences
FormatText
TypeBook chapter
Book titlePhonons in Semiconductor Nanostructures
Series titleNATO ASI Series; no. 236
ISSN0168-132X
ISBN978-94-010-4736-4
978-94-011-1683-1
Pages383–392
SubjectPhysics, general; Condensed Matter Physics; Optical and Electronic Materials; Surfaces and Interfaces, Thin Films
Abstract
Raman spectroscopy has shown that porous Si films produced by electrochemical and chemical dissolution of Si contain crystalline Si wires and spherites ~ 3 nm in diameter and/or amorphous Si. The optical absorption and photoluminescence spectra obtained from most of the samples are consistent with the quantum confinement of excitons in Si nanostructures. Other samples composed only of amorphous Si produced a different photoluminescence attributed to the formation of silicon oxyhydride species.
Publication date
LanguageEnglish
Peer reviewedYes
NPARC number23000346
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Record modified2019-01-31
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