Picosecond Imaging of Hot Electron Emission from CMOS Circuitry

From National Research Council Canada

Alternative titleSPIE
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Affiliation
  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
FormatText, Article
Conference2000
NPARC number12346208
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Record identifier8c12e6ad-2cac-47e7-9805-5d139d88607c
Record created2009-09-17
Record modified2020-04-16
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