Self-organized metal networks at ion-etched Cu/Si and Ag/Si interfaces

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1063/1.1868855
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FormatText, Article
Subjectcopper; interface structure; metal clusters; metallic thin films; Monte Carlo methods; nanopatterning; self-assembly; silver; sputter deposition; sputter etching; surface diffusion; surface morphology; X-ray photoelectron spectra
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LanguageEnglish
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NRC number17
NPARC number12338858
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Record identifier8f035cbc-9238-4fb9-a333-f9b89674b842
Record created2009-09-11
Record modified2020-04-07
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