DOI | Resolve DOI: https://doi.org/10.1017/S1431927612007027 |
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Author | Search for: Mcleod, Robert A.1; Search for: Malac, Marek1 |
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Affiliation | - National Research Council of Canada. Security and Disruptive Technologies
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Format | Text, Article |
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Conference | Microscopy & Microanalysis 2012, July 29 - August 2, 2012, Phoenix, Arizona, United States |
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Abstract | Energy electron-loss spectroscopy (EELS) often requires extensive post-processing for quantitative interpretation of measured spectra [1, 2]. Often the first step in spectra interpretation involves removal of plural scattering, which can be accomplished by Fourier-log deconvolution. The spectral features are often broadened by various instrumental factors including detector response, electron-source energy width and various instabilities. Here we show that Fourier-log deconvolution followed by Richardson-Lucy deconvolution both removes plural scattering and sharpens the spectral features of the recorded spectra without introducing obvious artifacts [3]. We demonstrate the performance of two-step deconvolution using a hexagonal Boron Nitride (hBN) sample suspended over holes in a lacey carbon film. The boron-K edge, shown in Figure 1, exhibits rich near-edge fine structure, as discussed in detail in [4]. As a measure of the energy resolution of the spectra at the core-edge energy loss, we use the width of the peak A at 192 eV and the separation of the splitting in peak B at 198 eV in Figure 1. |
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Publication date | 2012-11-23 |
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Publisher | Cambridge University Press |
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In | |
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Language | English |
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Peer reviewed | Yes |
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Export citation | Export as RIS |
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Report a correction | Report a correction (opens in a new tab) |
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Record identifier | 95f17c7f-c741-4b6d-8e3c-59df7f39367d |
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Record created | 2020-03-10 |
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Record modified | 2024-05-15 |
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