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Surface damage formation during ion-beam thinning of samples for transmission electron microscopy

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1016/S0304-3991(00)00096-6
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Affiliation
  1. National Research Council Canada. NRC Institute for National Measurement Standards
FormatText, Article
Publication date
In
  • Ultramicroscopy 87, no. 3 (2001): 97–104.
NPARC number12743861
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Record identifier986ae842-eb45-4f83-823b-d4ac2d8f8b8e
Record created2009-10-27
Record modified2020-03-27
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