Machine learning pattern recognition in integrated silicon photonics design

DOIResolve DOI: https://doi.org/10.1109/PN50013.2020.9166993
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Affiliation
  1. National Research Council Canada. Advanced Electronics and Photonics
  2. National Research Council Canada. Digital Technologies
FormatText, Article
Conference2020 Photonics North (PN), May 26-28, 2020, Niagara Falls, Ontario
Physical description1 p.
Subjectnanophotonics; silicon photonics; optimization; machine learning; pattern recognition; principal component analysis (PCA); dimensionality reduction; inverse design
Abstract
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PublisherIEEE
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LanguageEnglish
Peer reviewedYes
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Record identifier9d9404b9-7fbf-4d34-937d-b5abeb4d8fcb
Record created2021-07-21
Record modified2021-07-23

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